This paper presents an inspection method of particle contamination for semiconductor reticles using continuous wavelet transform. Particle defect is considered as a singularity in...
Using different algorithms to segment different images is a quite straightforward strategy for automated image segmentation. But the difficulty of the optimal algorithm selection ...
Abstract. We present a fast and robust iterative method for interpreting face images under non-uniform lighting conditions by using a fitting algorithm which utilizes an illuminat...
Salvador E. Ayala-Raggi, Leopoldo Altamirano Roble...