1414 search results - page 31 / 283 » Automated Metamorphic Testing |
ITNG
2010
IEEE
14 years 23 days ago
2010
IEEE
DATE
2002
IEEE
14 years 19 days ago
2002
IEEE
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
ICSE
2009
IEEE-ACM
14 years 8 days ago
2009
IEEE-ACM
ICSE
2009
IEEE-ACM
14 years 8 days ago
2009
IEEE-ACM
ICSE
2009
IEEE-ACM
14 years 8 days ago
2009
IEEE-ACM
