1680 search results - page 31 / 336 » Automated Model Selection for Simulation |
WSC
2007
13 years 10 months ago
2007
The transition to 300mm wafer size introduced a lot of new technologies to wafer fabrication facilities that mandated the presence of intrabay automated material handling systems ...
WSC
2007
13 years 10 months ago
2007
Semiconductor wafer fabrication facilities (wafer fabs) are among the most complex production facilities. A large product variety, hundreds of processing steps per product, hundre...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
We describe a technique for verifying that a hardware design correctly implements a protocol-level formal specification. Simulation steps are translated to protocol state transiti...
GECCO
2008
Springer
13 years 8 months ago
2008
Springer
Standard tournament selection samples individuals with replacement. The sampling-with-replacement strategy has its advantages but also has issues. One of the commonly recognised i...
ICIAR
2004
Springer
14 years 1 months ago
2004
Springer
The automated flaw detection in aluminium castings consists of two steps: a) identification of potential defects using image processing techniques, and b) classification of pote...