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» Automated Software Test Data Generation for Complex Programs
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SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
14 years 1 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
HASKELL
2007
ACM
13 years 11 months ago
Haskell program coverage
We describe the design, implementation and use of HPC, a toolkit to record and display Haskell Program Coverage. HPC includes tools that instrument Haskell programs to record prog...
Andy Gill, Colin Runciman
OOPSLA
2010
Springer
13 years 6 months ago
Random testing for higher-order, stateful programs
Testing is among the most effective tools available for finding bugs. Still, we know of no automatic technique for generating test cases that expose bugs involving a combination ...
Casey Klein, Matthew Flatt, Robert Bruce Findler
TCAD
2010
102views more  TCAD 2010»
13 years 2 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
ISSTA
2004
ACM
14 years 1 months ago
Test input generation with java PathFinder
We show how model checking and symbolic execution can be used to generate test inputs to achieve structural coverage of code that manipulates complex data structures. We focus on ...
Willem Visser, Corina S. Pasareanu, Sarfraz Khursh...