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2009
IEEE
110views Hardware» more  DATE 2009»
14 years 4 months ago
Trace signal selection for visibility enhancement in post-silicon validation
Today’s complex integrated circuit designs increasingly rely on post-silicon validation to eliminate bugs that escape from presilicon verification. One effective silicon debug ...
Xiao Liu, Qiang Xu
ISSTA
2000
ACM
14 years 2 months ago
Simplifying failure-inducing input
Given some test case, a program fails. Which part of the test case is responsible for the particular failure? We show how our delta debugging algorithm generalizes and simplifies...
Ralf Hildebrandt, Andreas Zeller
SIGSOFT
2007
ACM
14 years 10 months ago
Context-based detection of clone-related bugs
Studies show that programs contain much similar code, commonly known as clones. One of the main reasons for introducing clones is programmers' tendency to copy and paste code...
Lingxiao Jiang, Zhendong Su, Edwin Chiu
ISSTA
2012
ACM
12 years 3 days ago
Isolating failure causes through test case generation
Manual debugging is driven by experiments—test runs that narrow down failure causes by systematically confirming or excluding individual factors. The BUGEX approach leverages t...
Jeremias Röbetaler, Gordon Fraser, Andreas Ze...
CAINE
2004
13 years 11 months ago
Automated Error-Prevention and Error-Detection Tools for Assembly Language
- Automated tools for error prevention and error detection exist for many high-level languages, but have been nonexistent for assembly-language programs, embedded programs in parti...
Lance G. Johnson, David C. Pheanis