514 search results - page 44 / 103 » Automated test data generation for aspect-oriented programs |
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
ISSRE
2007
IEEE
13 years 10 months ago
2007
IEEE
Constraint-Based Testing (CBT) is the process of generating test cases against a testing objective by using constraint solving techniques. In CBT, testing objectives are given und...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Multimedia SoCs are characterized by a main controller that directs the activity of several cores, each of which is in charge of a stage in the processing of a media stream. The v...
COR
2008
2008
Observations in using parallel and sequential evolutionary algorithms for automatic software testing
13 years 9 months ago
In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...
ISSTA
2009
ACM
14 years 3 months ago
2009
ACM
Many automatic testing, analysis, and verification techniques for programs can be effectively reduced to a constraint-generation phase followed by a constraint-solving phase. Th...