1295 search results - page 170 / 259 » Automatic Design Pattern Detection |
WWW
2011
ACM
13 years 3 months ago
2011
ACM
Facial attributes such as gender, race, age, hair style, etc., carry rich information for locating designated persons and profiling the communities from image/video collections (...
PVLDB
2010
13 years 7 months ago
2010
Our analysis of many real-world event based applications has revealed that existing Complex Event Processing technology (CEP), while effective for efficient pattern matching on e...
ASPDAC
2007
ACM
14 years 29 days ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
CHI
2004
ACM
14 years 9 months ago
2004
ACM
Ubiquitous, context-aware computer systems may ultimately enable computer applications that naturally and usefully respond to a user's everyday activity. Although new algorit...
SYNASC
2005
IEEE
14 years 2 months ago
2005
IEEE
Code duplication is a common problem, and a wellknown sign of bad design. As a result of that, in the last decade, the issue of detecting code duplication led to various solutions...