302 search results - page 61 / 61 » Automatic Verification of Timed Circuits |
HPCA
2006
IEEE
14 years 9 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
DFT
2006
IEEE
14 years 2 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...