During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
Testing is the primary software validation technique used by industry today, but remains ad hoc, error prone, and very expensive. A promising improvement is to automatically genera...
Anders Hessel, Kim Guldstrand Larsen, Brian Nielse...
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
Search-based test-data generation has proved successful for code-level testing but almost no search-based work has been carried out at evels of abstraction. In this paper the appl...