90 search results - page 5 / 18 » Automatic generation of synthetic sequential benchmark circu... |
ATS
1997
IEEE
13 years 11 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
ICCD
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper presents a new approach to the automated generation of an initialization sequence for synchronous sequential circuits. Finding an initialization sequence is a hard task...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
DAC
1997
ACM
13 years 11 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
TC
2008
13 years 6 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...