78 search results - page 7 / 16 » Automatic test generation using genetically-engineered disti... |
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
CVPR
2007
IEEE
14 years 9 months ago
2007
IEEE
Groupwise shape registration of raw edge sequence is addressed. Automatically extracted edge maps are treated as noised input shape of the deformable object and their registration...
TC
1998
13 years 7 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
BMCBI
2006
13 years 7 months ago
2006
Background: Proteins are comprised of one or several building blocks, known as domains. Such domains can be classified into families according to their evolutionary origin. Wherea...
KBSE
2007
IEEE
14 years 1 months ago
2007
IEEE
Concurrent programs are difficult to debug and verify because of the nondeterministic nature of concurrent executions. A particular concurrency-related bug may only show up under ...