1098 search results - page 165 / 220 » Averaging Expert Predictions |
ICIP
2008
IEEE
14 years 2 months ago
2008
IEEE
The structural similarity (SSIM) metric and its multi-scale extension (MS-SSIM) evaluate visual quality with a modied local measure of spatial correlation consisting of three c...
ISCAS
2008
IEEE
14 years 2 months ago
2008
IEEE
— Speech signals acquired in a reverberant room with microphones positioned at a distance from the talker are degraded in quality due to reverberation and measurement noise. Ther...
ISCAS
2008
IEEE
14 years 2 months ago
2008
IEEE
Abstract—Since the xDSL specifications impose stringent linearity requirements to ensure the integrity of the data transferred, current line drivers use linear amplifiers. The do...
LCN
2008
IEEE
14 years 2 months ago
2008
IEEE
Abstract—Active measurements on network paths provide endto-end network health status in terms of metrics such as bandwidth, delay, jitter and loss. Hence, they are increasingly ...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...