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» Balance Testing of Logic Circuits
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DAC
2009
ACM
14 years 9 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
DFT
1999
IEEE
114views VLSI» more  DFT 1999»
14 years 27 days ago
Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM
A programmable single-chip multiprocessor system for video coding has been developed. The system is implemented in a high-performance 0.25 m logic/embedded DRAM process. It integr...
Markus Rudack, Dirk Niggemeyer
ITC
1996
IEEE
107views Hardware» more  ITC 1996»
14 years 23 days ago
Orthogonal Scan: Low-Overhead Scan for Data Paths
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
Robert B. Norwood, Edward J. McCluskey
TVLSI
2008
119views more  TVLSI 2008»
13 years 8 months ago
Automatic Design of Reconfigurable Domain-Specific Flexible Cores
Reconfigurable hardware is ideal for use in Systems-on-a-Chip, as it provides both hardware-level performance and post-fabrication flexibility. However, any one architecture is ra...
Katherine Compton, Scott Hauck
DAC
1997
ACM
14 years 24 days ago
STARBIST: Scan Autocorrelated Random Pattern Generation
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, M...