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GLVLSI
2005
IEEE
85views VLSI» more  GLVLSI 2005»
14 years 1 months ago
Utilizing don't care states in SAT-based bounded sequential problems
Boolean Satisfiability (SAT) solvers are popular engines used throughout the verification world. Bounded sequential problems such as bounded model checking and bounded sequentia...
Sean Safarpour, Görschwin Fey, Andreas G. Ven...
DAC
2005
ACM
13 years 9 months ago
Total power reduction in CMOS circuits via gate sizing and multiple threshold voltages
Minimizing power consumption is one of the most important objectives in IC design. Resizing gates and assigning different Vt’s are common ways to meet power and timing budgets. ...
Feng Gao, John P. Hayes
DATE
2009
IEEE
131views Hardware» more  DATE 2009»
14 years 2 months ago
An event-guided approach to reducing voltage noise in processors
Abstract—Supply voltage fluctuations that result from inductive noise are increasingly troublesome in modern microprocessors. A voltage “emergency”, i.e., a swing beyond tol...
Meeta Sharma Gupta, Vijay Janapa Reddi, Glenn H. H...
DAC
1997
ACM
13 years 11 months ago
Analysis and Evaluation of Address Arithmetic Capabilities in Custom DSP Architectures
—Many application-specific architectures provide indirect addressing modes with auto-increment/decrement arithmetic. Since these architectures generally do not feature an indexe...
Ashok Sudarsanam, Stan Y. Liao, Srinivas Devadas
DATE
2009
IEEE
88views Hardware» more  DATE 2009»
13 years 11 months ago
A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
Xiao Liu, Qiang Xu