53 search results - page 10 / 11 » Blocking artifact detection and reduction in compressed data |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
ICIAR
2004
Springer
14 years 28 days ago
2004
Springer
The automated flaw detection in aluminium castings consists of two steps: a) identification of potential defects using image processing techniques, and b) classification of pote...
JCIT
2010
13 years 2 months ago
2010
Artificial Neural Networks(ANNS) have top level of capability to progress the estimation of cracks in metal tubes. The aim of this paper is to propose an algorithm to identify mod...
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
ISCA
2009
IEEE
14 years 2 months ago
2009
IEEE
While microprocessor designers turn to multicore architectures to sustain performance expectations, the dramatic increase in parallelism of such architectures will put substantial...