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ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
13 years 11 months ago
Parameter Reduction for Variability Analysis by Slice Inverse Regression (SIR) Method
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
AAAI
2007
13 years 9 months ago
A Method for Large-Scale l1-Regularized Logistic Regression
Kwangmoo Koh, Seung-Jean Kim, Stephen P. Boyd