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ATS
1998
IEEE
112views Hardware» more  ATS 1998»
13 years 11 months ago
Integrated Current Sensing Device for Micro IDDQ Test
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
Koichi Nose, Takayasu Sakurai
ISSS
1998
IEEE
219views Hardware» more  ISSS 1998»
13 years 11 months ago
Issues in Embedded DRAM Development and Applications
After being niche markets for several years, application markets for one-chip integration of large DRAMs and logic circuits are growing very rapidly as the transition to 0.25
Doris Keitel-Schulz, Norbert Wehn
DAC
1995
ACM
13 years 10 months ago
Direct Performance-Driven Placement of Mismatch-Sensitive Analog Circuits
This paper presents a direct performance-driven placement algorithm for analog integrated circuits. The performance specications directly drive the layout tools without intermedi...
Koen Lampaert, Georges G. E. Gielen, Willy M. C. S...
TCAD
2002
137views more  TCAD 2002»
13 years 6 months ago
Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicouple
As very large scale integration (VLSI) circuit speed rapidly increases, the inductive effects of interconnect lines strongly impact the signal integrity of a circuit. Since these i...
Yungseon Eo, Seongkyun Shin, William R. Eisenstadt...
TC
2002
13 years 6 months ago
A Number System with Continuous Valued Digits and Modulo Arithmetic
This paper presents a novel number system based on signed continuous valued digits. Arithmetic operations in this number system are performed using simple analog circuitry, in con...
Aryan Saed, Majid Ahmadi, Graham A. Jullien