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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
CVPR
2004
IEEE
14 years 10 months ago
Fast, Integrated Person Tracking and Activity Recognition with Plan-View Templates from a Single Stereo Camera
Copyright 2004 IEEE. Published in Conference on Computer Vision and Pattern Recognition (CVPR-2004), June 27 - July 2, 2004, Washington DC. Personal use of this material is permit...
Michael Harville, Dalong Li
NSPW
2003
ACM
14 years 1 months ago
SELF: a transparent security extension for ELF binaries
The ability to analyze and modify binaries is often very useful from a security viewpoint. Security operations one would like to perform on binaries include the ability to extract...
Daniel C. DuVarney, V. N. Venkatakrishnan, Sandeep...
CCGRID
2007
IEEE
13 years 12 months ago
STORM: An Approach to Database Storage Management in Clustered Storage Environments
Database storage management in clustered storage environments is a manual, time-consuming, and error-prone task. Such management involves regular movement of database objects acro...
Kaushik Dutta, Raju Rangaswami
BMCBI
2010
104views more  BMCBI 2010»
13 years 8 months ago
FragViz: visualization of fragmented networks
Background: Researchers in systems biology use network visualization to summarize the results of their analysis. Such networks often include unconnected components, which popular ...
Miha Stajdohar, Minca Mramor, Blaz Zupan, Janez De...