307 search results - page 11 / 62 » Calculating Architectural Reliability via Modeling and Analy... |
CODES
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
BMCBI
2008
13 years 7 months ago
2008
Background: Ornithine decarboxylase antizymes are proteins which negatively regulate cellular polyamine levels via their affects on polyamine synthesis and cellular uptake. In vir...
ICC
2007
IEEE
14 years 1 months ago
2007
IEEE
— Approximating the sum of Log–Normal random variables (RVs) is a long–standing open issue, in the old and recent literature, and many approaches have been proposed to deal w...