38 search results - page 4 / 8 » Call Stack Coverage for Test Suite Reduction |
AICCSA
2001
IEEE
13 years 11 months ago
2001
IEEE
In corrective maintenance, selective regression testing includes test selection from previously run test suite and test coverage identification. We propose three reductionbased re...
ICSE
1994
IEEE-ACM
13 years 11 months ago
1994
IEEE-ACM
This paper describes a system called TESTTUBE that combines static and dynamic analysis to perform selective retesting of software systems written in C. TESTTUBEfirst identifies w...
DATE
2003
IEEE
14 years 22 days ago
2003
IEEE
This paper presents a on-chip stack based memory organization that effectively reduces the energy dissipation in programmable embedded system architectures. Most embedded systems ...
ASWEC
2007
IEEE
13 years 11 months ago
2007
IEEE
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
FMICS
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. The design flow of systems-on-a-chip (SoCs) identifies several abstraction levels higher than the Register-Transfer-Level that constitutes the input of the synthesis tool...