38 search results - page 7 / 8 » Call Stack Coverage for Test Suite Reduction |
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
PPOPP
2010
ACM
14 years 4 months ago
2010
ACM
As concurrent programming becomes prevalent, software providers are investing in concurrency libraries to improve programmer productivity. Concurrency libraries improve productivi...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper describes a novel technique called Embedded Test-bench Control (ETC), extensively used in the verification of Tensilica’s latest configurable processor. Conventional ...
FSTTCS
2009
Springer
14 years 2 months ago
2009
Springer
We introduce and study the donation center location problem, which has an additional application in network testing and may also be of independent interest as a general graph-theor...
PLDI
2003
ACM
14 years 21 days ago
2003
ACM
Profiling can accurately analyze program behavior for select data inputs. We show that profiling can also predict program locality for inputs other than profiled ones. Here loc...