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» Carving differential unit test cases from system test cases
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DFT
2003
IEEE
120views VLSI» more  DFT 2003»
14 years 2 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
ECLIPSE
2005
ACM
13 years 10 months ago
IDE Support for test-driven development and automated grading in both Java and C++
Students need to learn testing skills, and using test-driven development on assignments is one way to help students learn. We use a flexible automated grading system called Web-CA...
Anthony Allowatt, Stephen Edwards
ER
2000
Springer
126views Database» more  ER 2000»
14 years 9 days ago
Tool Support for Reuse of Analysis Patterns - A Case Study
: The size and complexity of modern information systems together with requirements for short development time increase the demands for reuse of already existing solutions. The idea...
Petia Wohed
UML
2001
Springer
14 years 1 months ago
A UML-Based Approach to System Testing
System testing is concerned with testing an entire system based on its specifications. In the context of object-oriented, UML development, this means that system test requirements ...
Lionel C. Briand, Yvan Labiche
KIVS
1997
Springer
14 years 26 days ago
Conformance Testing of Objects in Distributed Processing Systems
The object model is a very popular paradigm for building distributed applications. Several standardisation efforts are underway that define architectures for distributed computing...
Brigitte Bär, Kurt Geihs