Abstract--Cluster tools are widely used as semiconductor manufacturing equipment. While throughput analysis and scheduling of single-cluster tools have been well-studied, research ...
Jingang Yi, Shengwei Ding, Dezhen Song, Mike Tao Z...
A classic question in software development is “H ow much testing is enough?” Aside from dynamic coverage-based metrics, there are few measures that can be used to provide guid...
Nachiappan Nagappan, Laurie A. Williams, Jason Osb...
Aimed at verifying safety properties and improving simulation coverage for hybrid systems models of embedded control software, we propose a technique that combines numerical simul...
Rajeev Alur, Aditya Kanade, S. Ramesh, K. C. Shash...
A modelling language can be defined by a metamodel in UML class diagram. This paper defines the semantics of such metamodels through two mappings: a signature mapping from metamod...
Traditional design representations are inadequate for generalized reasoning about modularity in design and its technical and economic implications. We have developed an architectu...