An on-chip test-and-measurement system with digital interfaces that can perform device-level characterization of large-dense arrays of transistors is demonstrated in 90- and 65-nm...
Simeon Realov, William McLaughlin, Kenneth L. Shep...
E-business workloads are quite complex as demonstrated by the hierarchical workload characterization discussed here. While these features may pose challenges to performance model ...
Message-oriented middleware (MOM) is at the core of a vast number of financial services and telco applications, and is gaining increasing traction in other industries, such as man...
Kai Sachs, Samuel Kounev, Jean Bacon, Alejandro P....