27 search results - page 4 / 6 » Code-coverage Based Test Vector Generation for SystemC Desig... |
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
ITC
2003
IEEE
14 years 21 days ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
FMCAD
2006
Springer
13 years 11 months ago
2006
Springer
The importance of re-usable Intellectual Properties (IPs) cores is increasing due to the growing complexity of today's system-on-chip and the need for rapid prototyping. In th...
PATMOS
2000
Springer
13 years 11 months ago
2000
Springer
Abstract. Reduction of chip packaging and cooling costs for deep sub-micron SystemOn-Chip (SOC) designs is an emerging issue. We present a simulation-based methodology able to real...
FSKD
2005
Springer
14 years 29 days ago
2005
Springer
A new robust clustering scheme based on fuzzy c-means is proposed and the concept of a fuzzy mega-cluster is introduced in this paper. The fuzzy mega-cluster is conceptually simila...