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ITC
2000
IEEE
93views Hardware» more  ITC 2000»
14 years 1 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
ICPP
2007
IEEE
14 years 2 months ago
Multi-Layer Event Trace Analysis for Parallel I/O Performance Tuning
The complexity of parallel I/O systems lies in the deep I/O stack with many software layers and concurrent I/O request handling at multiple layers. This paper explores multi-layer...
Pin Lu, Kai Shen
ICDAR
2005
IEEE
14 years 2 months ago
Historical Recall and Precision: Summarizing Generated Hypotheses
Document recognition involves many kinds of hypotheses: segmentation hypotheses, classification hypotheses, spatial relationship hypotheses, and so on. Many recognition strategie...
Richard Zanibbi, Dorothea Blostein, James R. Cordy
PERCOM
2009
ACM
14 years 3 months ago
Markov Chain Existence and Hidden Markov Models in Spectrum Sensing
—The primary function of a cognitive radio is to detect idle frequencies or sub-bands, not used by the primary users (PUs), and allocate these frequencies to secondary users. The...
Chittabrata Ghosh, Carlos de M. Cordeiro, Dharma P...
HICSS
2008
IEEE
132views Biometrics» more  HICSS 2008»
14 years 3 months ago
Monitoring of Power System Dynamic Behavior Using Characteristic Ellipsoid Method
The potential uses of the sub-second GPSsynchronized phasor data collected from various locations within an electric power system promise endless benefits for the applications tar...
Yuri V. Makarov, Carl H. Miller, Tony B. Nguyen