As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
We present a computationally efficient segmentationrestoration method, based on a probabilistic formulation, for the joint estimation of the label map (segmentation) and the para...
This paper looks at the nonparametric, multiscale, Markov Random Field (MRF) model and its application in classifying the MeasTex Test Suite. The MeasTex Test Suite is a standard ...
Consider the problem of joint parameter estimation and prediction in a Markov random field: i.e., the model parameters are estimated on the basis of an initial set of data, and th...
—This paper addresses the problem of self-validated labeling of Markov random fields (MRFs), namely to optimize an MRF with unknown number of labels. We present graduated graph c...