164 search results - page 20 / 33 » Combining Algebraic and Model-Based Test Case Generation |
VTS
2003
IEEE
13 years 12 months ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
TCAD
2011
13 years 1 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
RSA
2006
13 years 6 months ago
2006
We continue the investigation of locally testable codes, i.e., error-correcting codes for whom membership of a given word in the code can be tested probabilistically by examining ...
CVPR
2007
IEEE
14 years 8 months ago
2007
IEEE
Where am I and what am I seeing? This is a classical vision problem and this paper presents a solution based on efficient use of a combination of 2D and 3D features. Given a model...
AMOST
2007
ACM
13 years 10 months ago
2007
ACM
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...