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DAC
2007
ACM
14 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
SP
2002
IEEE
128views Security Privacy» more  SP 2002»
13 years 8 months ago
Fitting hidden Markov models to psychological data
Markov models have been used extensively in psychology of learning. Applications of hidden Markov models are rare however. This is partially due to the fact that comprehensive stat...
Ingmar Visser, Maartje E. J. Raijmakers, Peter C. ...
ICRA
2009
IEEE
160views Robotics» more  ICRA 2009»
14 years 3 months ago
Tracking of facial features to support human-robot interaction
— In this paper we present a novel methodology for detection and tracking of facial features like eyes, nose and mouth in image sequences. The proposed methodology is intended to...
Maria Pateraki, Haris Baltzakis, Polychronis Konda...
BMCBI
2005
178views more  BMCBI 2005»
13 years 8 months ago
A quantization method based on threshold optimization for microarray short time series
Background: Reconstructing regulatory networks from gene expression profiles is a challenging problem of functional genomics. In microarray studies the number of samples is often ...
Barbara Di Camillo, Fatima Sanchez-Cabo, Gianna To...
TMI
1998
155views more  TMI 1998»
13 years 8 months ago
Spatio-temporal fMRI Analysis using Markov Random Fields
Abstract—Functional magnetic resonance images (fMRI’s) provide high-resolution datasets which allow researchers to obtain accurate delineation and sensitive detection of activa...
Xavier Descombes, Frithjof Kruggel, D. Yves von Cr...