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DATE
2003
IEEE
98views Hardware» more  DATE 2003»
14 years 1 months ago
On the Characterization of Hard-to-Detect Bridging Faults
We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults...
Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu
IOLTS
2002
IEEE
99views Hardware» more  IOLTS 2002»
14 years 1 months ago
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
Davide Appello, Alessandra Fudoli, Vincenzo Tancor...
VTS
2000
IEEE
99views Hardware» more  VTS 2000»
14 years 16 days ago
Virtual Scan Chains: A Means for Reducing Scan Length in Cores
A novel design-for-test (DFT) technique is presented for designing a core with a “virtual scan chain” which looks (to the system integrator) like it is shorter than the real s...
Abhijit Jas, Bahram Pouya, Nur A. Touba
HAPTICS
2010
IEEE
14 years 15 days ago
Haptic/VR Assessment Tool for Fine Motor Control
Abstract. The Nine Hole Peg Test (NHPT) is routinely used in clinical environments to evaluate a patient's fine hand control. A physician measures the total time required to i...
Christophe Emery, Evren Samur, Olivier Lambercy, H...
ECLIPSE
2005
ACM
13 years 10 months ago
IDE Support for test-driven development and automated grading in both Java and C++
Students need to learn testing skills, and using test-driven development on assignments is one way to help students learn. We use a flexible automated grading system called Web-CA...
Anthony Allowatt, Stephen Edwards