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ITC
1999
IEEE
178views Hardware» more  ITC 1999»
14 years 18 days ago
Embedded X86 testing methodology
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...
Luis Basto, Asif Khan, Pete Hodakievic
ATS
2000
IEEE
116views Hardware» more  ATS 2000»
14 years 22 days ago
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
Said Hamdioui, A. J. van de Goor
CORR
2006
Springer
123views Education» more  CORR 2006»
13 years 8 months ago
Continuations, proofs and tests
Continuation Passing Style (CPS) is one of the most important issues in the field of functional programming languages, and the quest for a primitive notion of types for continuati...
Stefano Guerrini, Andrea Masini
CSDA
2008
52views more  CSDA 2008»
13 years 8 months ago
Semi-parametric specification tests for mixing distributions
We present a semi-parametric method for testing mixing distributions in the mixed Poisson model. The proposed method, which is based on the generalized method of moments, does not...
Yue Fang
JLP
2008
91views more  JLP 2008»
13 years 8 months ago
Local variable scoping and Kleene algebra with tests
We explore the power of relational semantics and equational reasoning in the style of Kleene algebra for analyzing programs with mutable, statically scoped local variables. We prov...
Kamal Aboul-Hosn, Dexter Kozen