An experimental analysis of spot defects in SRAMs: realistic fault models and tests

: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed into functional fault models. The existence of the usually used theoretical memory fault models will be verified and new on,es will be presented. Finally, a new march test detecting all realistic faults, with a test length of 14n, will be introduced, and its fault coverage is compared with other known tests. Key words: SRAMs, fault models, spot defects, march tests, fault coverage.

• Type: Conference
• Year: 2000
• Where: ATS
• Authors: Said Hamdioui, A. J. van de Goor
• Keywords: ATS 2000, Fault Coverage, Fault Models, Hardware, Spot Defects