Abstract. This paper presents a Bayesian inference algorithm for image layer representation [26], 2.1D sketch [6], with mixed Markov random field. 2.1D sketch is an very important...
We present a novel variational approach to top-down image segmentation, which accounts for significant projective transformations between a single prior image and the image to be s...
In recent literature it has been reported that Dynamic Power Management (DPM) may lead to decreased reliability in real-time embedded systems. The ever-shrinking device sizes cont...
Ranjani Sridharan, Nikhil Gupta, Rabi N. Mahapatra
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...