1414 search results - page 179 / 283 » Completion Energies and Scale |
EMMCVPR
2007
Springer
14 years 4 months ago
2007
Springer
Abstract. This paper presents a Bayesian inference algorithm for image layer representation [26], 2.1D sketch [6], with mixed Markov random field. 2.1D sketch is an very important...
ECCV
2004
Springer
15 years 16 days ago
2004
Springer
We present a novel variational approach to top-down image segmentation, which accounts for significant projective transformations between a single prior image and the image to be s...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
In recent literature it has been reported that Dynamic Power Management (DPM) may lead to decreased reliability in real-time embedded systems. The ever-shrinking device sizes cont...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...