We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
The behaviour of many systems is naturally modelled by a set of ordinary differential equations (ODEs) which are parametric. Since decisions are often based on relations over these...
The dramatically increasing size of polygonal models resulting from 3D scanning devices and advanced modeling techniques requires new approaches to reduce the load of geometry tran...
In recent years, a number of link scheduling algorithms have been proposed that greatly improve upon traditional FIFO scheduling in being able to assure rate and delay bounds for ...
We provide a method whereby, given mode and (upper approximation) type information, we can detect procedures and goals that can be guaranteed to not fail (i.e., to produce at leas...