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DATE
2000
IEEE
136views Hardware» more  DATE 2000»
14 years 1 months ago
Parametric Fault Simulation and Test Vector Generation
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
Khaled Saab, Naim Ben Hamida, Bozena Kaminska
ISMIR
2004
Springer
124views Music» more  ISMIR 2004»
14 years 2 months ago
Eigenrhythms: Drum pattern basis sets for classification and generation
We took a collection of 100 drum beats from popular music tracks and estimated the measure length and downbeat position of each one. Using these values, we normalized each pattern...
Dan Ellis, John Arroyo
ACL
1997
13 years 10 months ago
An Algorithm for Generating Referential Descriptions with Flexible Interfaces
Most algorithms dedicated to the generation of referential descriptions widely suffer from a fundamental problem: they make too strong assumptions about adjacent processing compon...
Helmut Horacek
ICST
2010
IEEE
13 years 7 months ago
Timed Moore Automata: Test Data Generation and Model Checking
Abstract—In this paper we introduce Timed Moore Automata, a specification formalism which is used in industrial train control applications for specifying the real-time behavior ...
Helge Löding, Jan Peleska
CSC
2007
13 years 10 months ago
Visualization a la Unix
A visualization framework can be seen as a solution to a specialized data flow problem. Spiegel1 is a visualization framework which uses the Unix pipeline model to execute program...
Hans-Peter Bischof, Tim Peterson