4647 search results - page 235 / 930 » Composite Design Patterns |
ISORC
1998
IEEE
14 years 3 months ago
1998
IEEE
Many engineers are still reluctant to adopt advanced object-oriented technologies (such as high modularity, dynamic binding, automatic garbage collection, etc.) for embedded syste...
ATS
2009
IEEE
14 years 5 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
DDECS
2006
IEEE
14 years 4 months ago
2006
IEEE
- Extension of a BIST design algorithm is proposed in this paper. The method is based on a synthesis of a combinational block - the decoder, transforming pseudo-random code words i...
ISCAS
1999
IEEE
14 years 3 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
CGVR
2006
14 years 6 days ago
2006
- This paper presents a technique of evolutionary design for plants in virtual worlds, inspired from Richard Dawkins' adaptive walks within the space of biomorph structures. T...