565 search results - page 14 / 113 » Compositional dynamic test generation |
KBSE
1998
IEEE
14 years 23 days ago
1998
IEEE
Structural testing criteria are mandated in many software development standards and guidelines. The process of generating test-data to achieve 100 coverage of a given structural c...
DATE
1999
IEEE
14 years 25 days ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
QSIC
2003
IEEE
14 years 1 months ago
2003
IEEE
A character string is an important element in programming. A problem that needs further research is how to automatically generate software test data for character strings. This pa...
ET
2002
13 years 8 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
MTDT
2003
IEEE
14 years 1 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...