In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Model-based clustering of motion trajectories can be posed as the problem of learning an underlying mixture density function whose components correspond to motion classes with dif...
In this paper we present two software tools for the simulation of electron multiplication processes in radio frequency (RF) waveguides. The electric discharges are caused by the m...
In this paper, we consider the problems of generating all maximal (bipartite) cliques in a given (bipartite) graph G = (V, E) with n vertices and m edges. We propose two algorithms...
This work focuses on the basic stochastic decomposition (SD) algorithm of Higle and Sen [J.L. Higle, S. Sen, Stochastic Decomposition, Kluwer Academic Publishers, 1996] for two-st...