As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
Automatic, defect tolerant registration of transmission electron microscopy (TEM) images poses an important and challenging problem for biomedical image analysis, e.g. in computat...
We address visual correspondence problems without assuming that scene points have similar intensities in different views.This situation is common, usually due to non-lambertian sc...
In this paper, we consider the problem of supporting fault tolerance for adaptive and time-critical applications in heterogeneous and unreliable grid computing environments. Our g...