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IWANN
1995
Springer
13 years 11 months ago
Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
José Luis Bernier, Juan J. Merelo Guerv&oac...
IPPS
1998
IEEE
13 years 12 months ago
Meta-heuristics for Circuit Partitioning in Parallel Test Generation
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...
Consolación Gil, Julio Ortega, Antonio F. D...
AE
2007
Springer
14 years 1 months ago
Generating SAT Local-Search Heuristics Using a GP Hyper-Heuristic Framework
We present GP-HH, a framework for evolving local-search 3-SAT heuristics based on GP. The aim is to obtain “disposable” heuristics which are evolved and used for a specific su...
Mohamed Bahy Bader-El-Den, Riccardo Poli
JCP
2008
114views more  JCP 2008»
13 years 7 months ago
IntelligenTester - Test Sequence Optimization Framework using Multi-Agents
- Our paper focuses on the generation of optimal test sequences and test cases using Intelligent Agents for highly reliable systems. Test sequences support test case generation for...
D. Jeya Mala, V. Mohan
TAINN
2005
Springer
14 years 1 months ago
An Evolutionary Local Search Algorithm for the Satisfiability Problem
Satisfiability problem is an NP-complete problem that finds itself or its variants in many combinatorial problems. There exist many complete algorithms that give successful results...
Levent Aksoy, Ece Olcay Gunes