4299 search results - page 10 / 860 » Concurrent Test Generation |
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
ICFEM
2004
Springer
14 years 22 days ago
2004
Springer
Reachability testing is a technique for testing concurrent programs. Reachability testing derives test sequences on-the-fly as the testing process progresses, and can be used to sy...
GLVLSI
2002
IEEE
14 years 9 days ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
GRID
2004
Springer
14 years 22 days ago
2004
Springer
We present DiPerF, a distributed performance-testing framework, aimed at simplifying and automating service performance evaluation. DiPerF coordinates a pool of machines that test...
TACAS
2010
Springer
13 years 5 months ago
2010
Springer
The choice of where a thread scheduling algorithm preempts one thread in order to execute another is essential to reveal concurrency errors such as atomicity violations, livelocks,...