4299 search results - page 31 / 860 » Concurrent Test Generation |
119
click to vote
DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
122
click to vote
GECCO
2009
Springer
15 years 7 months ago
2009
Springer
This paper introduces TestFul, a framework for testing stateful systems and focuses on object-oriented software. TestFul employs a hybrid multi-objective evolutionary algorithm, t...
105
click to vote
INFSOF
2002
15 years 1 months ago
2002
Petri nets have been extensively used in the modelling and analysis of concurrent and distributed systems. The veri
127
click to vote
SERP
2007
15 years 3 months ago
2007
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
110
Voted
CC
2005
Springer
15 years 7 months ago
2005
Springer
Abstract. Generational collectors are well known as a tool for shortening pause times incurred by garbage collection and for improving garbage collection efficiency. In this paper,...