4299 search results - page 38 / 860 » Concurrent Test Generation |
QSIC
2005
IEEE
14 years 2 months ago
2005
IEEE
Fault-based testing is a technique where testers anticipate errors in a system under test in order to assess or generate test cases. The idea is to have enough test cases capable ...
FLAIRS
2004
13 years 10 months ago
2004
A distributed search algorithm for solving distributed constraint satisfaction problems (DisCSPs) is presented. The proposed algorithm is composed of multiple search processes (SP...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
DAC
2000
ACM
14 years 9 months ago
2000
ACM
This paper presents a novel compiler for Esterel, a concurrent synchronous imperative language. It generates fast, small object code by compiling away concurrency, producing a sin...