4299 search results - page 38 / 860 » Concurrent Test Generation |
QSIC
2005
IEEE
15 years 8 months ago
2005
IEEE
Fault-based testing is a technique where testers anticipate errors in a system under test in order to assess or generate test cases. The idea is to have enough test cases capable ...
141
Voted
FLAIRS
2004
15 years 3 months ago
2004
A distributed search algorithm for solving distributed constraint satisfaction problems (DisCSPs) is presented. The proposed algorithm is composed of multiple search processes (SP...
92
Voted
ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
123
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ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
117
Voted
DAC
2000
ACM
16 years 3 months ago
2000
ACM
This paper presents a novel compiler for Esterel, a concurrent synchronous imperative language. It generates fast, small object code by compiling away concurrency, producing a sin...