4299 search results - page 41 / 860 » Concurrent Test Generation |
DATE
1997
IEEE
14 years 21 days ago
1997
IEEE
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....
SIAMCOMP
2010
13 years 6 months ago
2010
Some systems interact with their environment at physically distributed interfaces, called ports, and in testing such a system it is normal to place a tester at each port. Each test...
FATES
2006
Springer
14 years 4 days ago
2006
Springer
Input-output conformance test theory for discrete systems has established itself in research and industry already. A couple of years ago also input-output conformance test theories...
ATS
2005
IEEE
14 years 2 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
CSIE
2009
IEEE
13 years 9 months ago
2009
IEEE
Succinct test script with high efficiency is one of key point for automation of embedded software testing. In this paper, we integrated object technique with automated simulation ...