4299 search results - page 45 / 860 » Concurrent Test Generation |
CONCUR
2010
Springer
13 years 9 months ago
2010
Springer
Abstract. In this paper we introduce a real-time extension of the concurrent object modeling language Creol which is based on duration statements indicating best and worst case exe...
ISCAS
1999
IEEE
14 years 24 days ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
GECCO
2007
Springer
14 years 2 months ago
2007
Springer
Fault-based testing is often advocated to overcome limitations of other testing approaches; however it is also recognized as being expensive. On the other hand, evolutionary algor...
AOSD
2009
ACM
14 years 3 months ago
2009
ACM
Despite the upsurge of interest in the Aspect-Oriented Programming (AOP) paradigm, there remain few results on test data generation techniques for AOP. Furthermore, there is no wo...
SEKE
2010
Springer
13 years 6 months ago
2010
Springer
—The behavior of complex production automation systems is hard to predict, therefore simulation is used to study the likely system behavior. However, in a real-world system many ...