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ATS
1996
IEEE
117views Hardware» more  ATS 1996»
14 years 20 days ago
Hierarchical Test Generation with Built-In Fault Diagnosis
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
Dirk Stroobandt, Jan Van Campenhout
EUROCRYPT
2008
Springer
13 years 10 months ago
Precise Concurrent Zero Knowledge
Precise zero knowledge introduced by Micali and Pass (STOC'06) guarantees that the view of any verifier V can be simulated in time closely related to the actual (as opposed t...
Omkant Pandey, Rafael Pass, Amit Sahai, Wei-Lung D...
RV
2010
Springer
110views Hardware» more  RV 2010»
13 years 7 months ago
Interval Analysis for Concurrent Trace Programs Using Transaction Sequence Graphs
Abstract. Concurrent trace programs (CTPs) are slices of the concurrent programs that generate the concrete program execution traces, where inter-thread event order specific to th...
Malay K. Ganai, Chao Wang
ICST
2008
IEEE
14 years 2 months ago
Quality of Automatically Generated Test Cases based on OCL Expressions
In this paper, we deal with coverage criteria for boundary testing. We focus on the automatic generation of boundary tests based on OCL expressions and evaluate the quality of the...
Stephan Weißleder, Bernd-Holger Schlingloff
DEBU
2008
156views more  DEBU 2008»
13 years 8 months ago
Towards Automatic Test Database Generation
Testing is one of the most expensive and time consuming activities in the software development cycle. In order to reduce the cost and the time to market, many approaches to automa...
Carsten Binnig, Donald Kossmann, Eric Lo