4299 search results - page 6 / 860 » Concurrent Test Generation |
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT, including fault ordering, state predict...
CONCUR
2006
Springer
13 years 11 months ago
2006
Springer
Several applications of graph rewriting systems (notably, some encodings of calculi with name passing) require rules which, besides deleting and generating graph items, are able to...
WSC
2008
13 years 9 months ago
2008
One of the most important challenges for mining engineers is to correctly analyze and generate short-term planning schedules, or simply month mining plan. The objective is to demo...
APSEC
1996
IEEE
13 years 11 months ago
1996
IEEE
Testing of concurrent programs is much more difficult than that of sequential programs. A concurrent program behaves nondeterministically, that is, the program may produce differe...
ISORC
2005
IEEE
14 years 28 days ago
2005
IEEE
Web Services form a new distributed computing paradigm. Collaborative verification and validation are important when Web Services from different vendors are integrated together to...