4299 search results - page 82 / 860 » Concurrent Test Generation |
118
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GECCO
2009
Springer
15 years 9 months ago
2009
Springer
The critical functionality of many software applications relies on code that performs mathematically complex computations. However, such code is often difficult to test owing to t...
101
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DATE
2000
IEEE
15 years 7 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
141
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APSEC
2004
IEEE
15 years 6 months ago
2004
IEEE
Unit testing is a methodology for testing small parts of an application independently of whatever application uses them. It is time consuming and tedious to write unit tests, and ...
152
Voted
ATS
1998
IEEE
15 years 6 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
102
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SGAI
2005
Springer
15 years 8 months ago
2005
Springer
SkillSum is an Artificial Intelligence (AI) and Natural Language Generation (NLG) system that produces short feedback reports for people who are taking online tests which check th...