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116
Voted
DAC
2007
ACM
16 years 3 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
127
Voted
ISSTA
2009
ACM
15 years 9 months ago
2009
ACM
Dynamic test generation consists of executing a program while gathering symbolic constraints on inputs from predicates encountered in branch statements, and of using a constraint ...
124
Voted
GLVLSI
2002
IEEE
15 years 7 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
129
Voted
TC
1998
15 years 2 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
120
Voted
KBSE
2007
IEEE
15 years 9 months ago
2007
IEEE
Randomized testing has been shown to be an effective method for testing software units. However, the thoroughness of randomized unit testing varies widely according to the settin...