4299 search results - page 91 / 860 » Concurrent Test Generation |
161
Voted
IFIP
2001
Springer
15 years 7 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
122
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TAP
2008
Springer
15 years 2 months ago
2008
Springer
Pex automatically produces a small test suite with high code coverage for a .NET program. To this end, Pex performs a systematic program analysis (using dynamic symbolic execution,...
114
Voted
ISSRE
2008
IEEE
15 years 9 months ago
2008
IEEE
Aspect-Oriented Programming (AOP) provides new modularization of software systems by encapsulating crosscutting concerns. AspectJ, an AOP language, uses abstractions such as point...
194
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CEC
2007
IEEE
15 years 9 months ago
2007
IEEE
— Generating test data for Object-Oriented (OO) software is a hard task. Little work has been done on the subject, and a lot of open problems still need to be investigated. In th...
125
Voted
ICCD
2006
IEEE
15 years 8 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...